- Wean Hall
- David Stork
- Chief Scientist of Ricoh Silicon Valley and Consulting Associate Porfessor of Electical Engineering at Stanford University
The Open Mind Initiative: A collaborative framework for collecting and learning netizen contributions to open source 'intelligent' software
The Open Mind Initiative is a collaborative framework for developing "intelligent" software (e.g. speech recognition, handwriting recognition, common sense reasoning,...) over the internet. While based on traditional open source methodology, Open Mind differs in its reliance on large numbers of non-specialist 'netizens' to provide raw data; there are many incentives for netizens to so contribute.This talk begins by examining several important trends that underline Open Mind: the rise in open source software, the expansion in opportunities for less-skilled users to contribute, the increase in scientific collaboration over the internet, the growing need for large sets of lq informa rq data from non-experts, and the growing need for lq intelligent rq software. Drawing upon the theory of machine learning, pattern recognition and techniques from experimental psychology, we discuss interactive methods for insuring high quality data, even from a large heterogeneous population of contributors. Next we discuss the relation of Open Mind to traditional open source and to data mining. Then we discuss sample projects, including three componenet projects currently committed, and conclude with a vision of future directions and opportunities. DR. David G. Stork is Chief Scientist of Ricoh Silicon Valley and Consulting Associate Professor of Electrical Engineering at Stanford University. His primary interests lie in pattern recognition, machine learning, neural networks and novel uses of the internet. A Distinguished Lecturer of the ACM, he sits on the editorial boards of five international journals and has published numerous peer-reviewed papers and five books, including "HAL's Legacy: 2001's computer as dream and reality" (MIT Press) for general audiences and the second edition of "Pattern Classification" with R. Duda and P.Hart (Wiley).
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